Ramtron International Corp has begun an AEC-Q100 automotive qualification programme for its FRAM devices. The company is aggressively pursuing plans to qualify its FRAM devices to AEC-Q100 (Automotive Electronic Council’s Stress Test Qualification for Integrated Circuits) standards, and is developing a number of FRAM configurations specified for the Grade 1 (-40 to +125C) operating range. This qualification programme has been developed to support a number of customer design-ins from in-cab applications to the vehicle’s most stringent environments.

Ramtron has already qualified two of its FRAM parts to AEC-Q100.

These are the FM25640 64Kbit serial SPI FRAM and the FM24CL16 16Kbit, 3V serial FRAM.

‘We are committed to meeting the design and sourcing challenges in the automotive industry with this line of AEC-Q100-qualified FRAM parts’, said Ramtron Vice President Mike Alwais.

‘No other nonvolatile memory solution can match FRAM’s fast write speed and high endurance’.

‘These latest developments are taking FRAM beyond in-cab applications into the vehicle’s most stringent environments’.

The AEC-Q100 qualification programme comes in tandem with the growing need for better nonvolatile data storage solutions in automotive subsystems.

Electronic content in vehicles is becoming ’smarter’ with the use of microcontrollers and sensors; FRAM already plays a vital role in high-content applications such as intelligent airbags, occupant sensors, infotainment systems, anti-pinch/trap sunroofs, automatic transmission, adaptive cruise control, steer-by-wire etc because it offers what older memories like EEPROM and Flash cannot: fast writes, high endurance and low power consumption.

Fast writes are beneficial when capturing data from sensors, especially in noisy automotive environments or when power may suddenly fail.

High endurance enables designers to capture information as often as they wish without the risk of wearing out the memory.