VLSI Testing — digital and mixed analogue/digital techniques: S.L. HURST (IEE, 1997, 532 pp., 65)

This text is another excellent addition to the IEE Circuits, Devices and Systems series. The book provides a comprehensive introduction and a reference for all aspects of IC testing, from practical test strategies and industrial practice, to economic and managerial issues. Unlike many books on the subject, it also gives in-depth coverage of analogue and mixed analogue/digital testing. I particularly like the succinct summaries and the long list of references given at the end of each chapter; these allow the reader to confirm he has understood the salient points and provide indicators to more advanced readings on the subject.

S. J. HARROLD Department of Electrical Engineering and Electronics, UMIST